Calibration artifact: 18nm step height, 3µm pitch. This VLSI Surface Topography Reference Dies have a variety of Step heights and Pitchs for daily monitoring of SPM performance. The silicon die with patterned layer of SiO2 is coated with Pt. All die are 8mm x 8mm and unmounted. They are not certified or traceable to NIST.
This VLSI Surface Topography Reference Dies have a variety of Step heights and Pitchs for daily monitoring of SPM performance.The silicon die with patterned layer of SiO2 is coated with Pt. All die are 8mm x 8mm and unmounted. They are not certified or tr
