PR-SSP10

PR-SSP10

48N/m, 190kHz, Supersharp, Alignment Grooves

  • Super sharp non-contact mode probe with alignment grooves for Brukers NEOS and NEOS SENTERRA AFMs.
    k = 48 N/m, f = 190 kHz
    Nominal tip radius < 2nm
  • Typical aspect ratio at 200 nm from tip apex in the order of 4:1.

    Tip Geometry: Super sharp
    Tip Radius (Nom): 2
  • The Aluminum reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers (< 2.5 µm), highly reflective samples, and machine vision applications.

    Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
    Cantilever Thickness (Nom): 7
    Cantilever Thickness (RNG): 6 - 8
    Cantilever Geometry: Rectangular
    Cantilevers Number: 11 - 31
    Back Side Coating: Reflective Aluminum