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    Web Store / Products / PR-EFM10
    PR-EFM10 - Systems for Research

    PR-EFM10

    PR-EFM10

    $717.60
    2.8N/m, 75kHz, Electrically Conductive Coating, Alignment Grooves

    • Electrostatic Force Microscopy (EFM) probes with alignment grooves for Brukers NEOS and NEOS SENTERRA AFMs.
      k = 2.8 N/m, f = 75 kHz

    • Tip Geometry: Standard (Steep)
      Tip Coating: Platinum/ Iridium
    • 25 nm thick double layer of chromium and platinum iridium5 on both sides of the cantilever. The tip side coating enhanes the conductivity of the tip and allows for electrical contacts. The detector side coating enhances the reflectivity of the laser beam by a factor of about 2 and prevents light from interfering within the cantilever.

      Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
      Cantilever Thickness (Nom): 3
      Cantilever Thickness (RNG): 2 - 4
      Cantilever Geometry: Rectangular
      Cantilevers Number: 11 - 31
      Front Side Coating: Platinum/ Iridium
      Back Side Coating: Reflective Platinum/ Iridium