2N/m, 70kHz, Tetrahedral Tip, Pt Coating

  • Olympus OMCL-AC240TM-R3

    OSCM-PT-R3 series probes have platinum-deposited cantilevers that aresuitable for conducting scanning probe microscopy in air usingelectric force microscopy (EFM) or Kelvin probe force microscopy (KFM) modes, with an unprecedented sharpness of 15nm radius as a metal coated probe.

    These probes feature:

    1. High electrical conductivity:The platinum-deposited probe shows lower conductivity in one and a halforders of magnitude than that of highly doped silicon probes. Its probe resistanceof 350 ohms is sufficiently low for electric measurements required highelectro-potential resolution. The surfaces of precious metal coatingsare free from oxidization and are electrically stable.
    2. High resolution:The apex of 15 nm (typ.) radius is prominently sharp among metal-coated probes. The thin and sharp tetrahedral probe reveals sample surface precisely both in electrically and in topographically.
    3. Visible apex tip:OSCM-PT-R3 has a tetrahedral tip on the exact end of thecantilever. Since the tip isn't hidden by the body of cantilever, it canbe positioned exactly at a point of interest using an opticalmicroscopy.

  • Tip Geometry: Visible Apex
    Tip Height: 9 - 19
    Front Angle: 0 ± 1
    Back Angle: 35 ±1
    Side Angle: 18 ±1
    Tip Radius (Nom): 15
    Tip Radius (Max): 25
  • Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.

    Cantilever Material: 0.01 - 0.02 Ωcm Silicon
    Cantilever Thickness (Nom): 2.3
    Cantilever Thickness (RNG): 1.6 - 3.0
    Cantilever Geometry: Rectangular
    Cantilevers Number: 1
    Front Side Coating: Conductive Platinum
    Back Side Coating: Reflective Aluminum