Contact mode probes (Silicon Nitride) for AFM-IR on the nanoIR

  •  10 pack of probes for contact mode imaging, IR spectroscopic measurements and contact resonance mapping in the nanoIR system.
    Microfabricated silicon nitride probes that have two cantilevers on each substrate; 100 and 200 microns long.
    Pre-mounted on half washer mounts for easy exchange in the nanoIR head.