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    Web Store / Products / Contact mode probes (Silicon) for AFM-IR on the nanoIR
    Contact mode probes (Silicon) for AFM-IR on the nanoIR - Systems for Research

    PR-EX-C450-10

    Contact mode probes (Silicon) for AFM-IR on the nanoIR

    $625.00

    •  10 pack of probes for contact mode imaging, IR spectroscopic measurements and contact resonance mapping in the nanoIR system.
      Microfabricated silicon probes with single cantilever ~450 microns long.
      Pre-mounted on half washer mounts for easy exchange in the nanoIR head.