PR-EX-nIR2-10

Contact mode probes for AFM-IR


  •  10 pack of probes for use in the nanoIR2/2S/2FS system for contact mode imaging, IR spectroscopic measurements, contact mode imaging, and contact resonance mapping. The probes are gold coated, microfabricated silicon probes that are ~450 microns long, premounted on half washer mounts for easy exchange in the nanoIR head.
    If 5 or more 10 packs of this probe are purchased at the same time then a 10% discount is applied to this line item.

  • Shape: Rotated
    Height: 17 μm - (15 - 19 μm)*
    Setback: 15 μm - (10 - 20 μm)*
    Radius: < 25 nm
    Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex
    Coating: Overall gold coating, 70 nm thick
    Shape: Beam
    Force Constant: 0.2 N/m (0.07 - 0.4 N/m)*
    Resonance Frequency: 13 kHz (9 - 17 kHz)*
    Length: 450 μm (440 - 460 μm)*
    Width: 50 μm (45 - 55 μm)*
    Thickness: 2 μm (1 - 3 μm)*
    * typical range