Visible Apex Tip, 42N/m, 300kHz, Al Reflex Coating, Wafer

  • Visible Apex Probe with highest performance and consistency.
    - 40 N/m, 300 kHz
    - Aluminum Reflex Coating
    - Wafer (375 Probes)
    - Also available as 10-Pack model VTESPA-300

    Bruker's New VTESPA-300 is the highest resolution visible apex tip on the market. It combines the advantage of a visible apex tip for feature targeting with the best measurement consistency and highest performance for TappingMode imaging.  It covers a wide range of TappingMode imaging applications and is ideal for roughness measurements, imaging IC devices, thin films, and crystal surfaces.  Key features of the probe include:

    1) Visible apex tip enables AFM imaging exactly at the location targeting through the AFM optics.

    2) Attains the highest consistency in AFM measurements due to industry best probe-to-probe consistency in tip radius, tip height, spring constant, and tapping frequency.

    3) Designed and optimized by Bruker, the inventor of TappingMode, to achieve the highest performance TappingMode imaging.

    4) Produces accurate images of rugged features, enabled by the narrow tip angle and forward pointing tip design that effectively compensates for the forward tilt of the AFM probe holder (typically 5-20 degrees).

  • Tip Geometry: Visible Apex
    Tip Height: 9.0 - 12
    Front Angle: 0 ± 2
    Back Angle: 54 ± 2
    Side Angle: 30 ± 2
    Tip Radius (Nom): 5
    Tip Radius (Max): 8
  • Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.

    Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
    Cantilever Thickness (Nom): 4.4
    Cantilever Thickness (RNG): 3.9 - 4.9
    Cantilever Geometry: Rectangular
    Cantilevers Number: 1
    Back Side Coating: Reflective Al