{"title":"SEM Specimen Holders","description":"","products":[{"product_id":"low-profile-70-mount-12-7mm","title":"SEM Pin Stub Specimen Mounts for EBSD","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e Low profile 70º EBSD SEM Mounts Ø12.7mm for Cambridge, Leica, ZEISS, LEO, FEI, Philips, CamScan, Tescan, ETEC, and Amray SEM's.\u003cbr\u003eAluminum, grooved edge, 9.5mm pin height \u003c\/p\u003e\n\u003cp\u003e\u003cemlow profile mount\u003e \u003c\/emlow\u003e\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32239710896265,"sku":"16109","price":9.2,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/16109.jpg?v=1755635225"},{"product_id":"pelco-pin-stub-extender","title":"PELCO® Pin Stub Extender","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003e12.5mm (1\/2\") high, pin stub extender allows bringing pin stubs and pin stub sample holders closer to the pole piece without moving the SEM sample stage. Multiple extenders are stackable. Compatible with all standard 3.2mm (1\/8\") pin stubs or pin stub SEM holders with maximum pin length of 10mm (0.4\"). Made of vacuum grade aluminum with stainless steel allen set screw. Allen key included\u003c\/p\u003e\n\u003cp\u003eScrew used is M3 x 3mm, Set, SS\u003cbr\u003ePELCO® Pin Stub Extender, 12.5mm (1\/2\"), 3.2mm (1\/8\") Pin\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32239713419401,"sku":"15318","price":74.1,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15318.jpg?v=1755635221"},{"product_id":"pelco-q-multi-pin-stub-holders","title":"PELCO® Q Multi Pin Stub Holders","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e\n\u003cp\u003e\u003cstrong\u003e PELCO® Scanning Electron Microscopy Pin Stubs \u003c\/strong\u003e\u003c\/p\u003e \u003cp\u003e\u003cem\u003e A new fundamentally improved pin stub for correlative, corroborative and repetitive microscopy.\u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003e The PELCO® Q Pin Stubs have been especially designed for correlative microscopy, corroborative SEM investigations and repetitive SEM imaging\/analysis and specimen preparation. The square PELCO® Q Stubs have an easy to locate reference notch on one of the corners. Using the SEM X and Y stage movements and read-outs, each position on the PELCO® Q Stub can be easily indexed to the reference notch. Once the position of a location is recorded with reference to the reference notch, the location can be easily found again using the same SEM, another SEM or FIB system, X-ray imaging system, Auger system, SIMS, light microscope or any imaging system with X and Y stage movements. It will work with manual, motorized and computerized stages as long as there is a position read-out. Depending on the precision of the stage, the recorded position can be retrieved with an accuracy of ±5µm. The reference notch in the corner of the PELCO® Q Stubs enables intrinsic indexing – no additional holders needed and the locations are all relative to the notch in the stub.\u003c\/p\u003e\n\u003cp\u003eThe sample surface of the PELCO® Q Stubs is square for easy alignment of the sides of the Q Stub with the X and Y movements of the sample stage. An additional advantage is the larger sample surface area; over 20% larger than round stubs. Below the square top, the PELCO® Q Stubs are identical to the conventional round pin mounts and are fully compatible with existing SEM grippers, storage boxes, sample preparation equipment and most multiple pin stub holders. Carbon tape such as #16073-1 can be used to make carbon tabs which cover the complete square surface.\u003c\/p\u003e\n\u003cp\u003eThe PELCO® Q Pin Stubs are available in 12.7mm (1\/2\"), 19mm (3\/4\") and 25.4mm (1\") square sample surface and a standard 3.2mm (1\/8\") pin. Compatible with SEMs, FESEMs and SEM\/FIB systems from FEI\/Philips, Tescan, Cambridge, Leica, Amray, ASPEX, and Camscan. Also suitable for Zeiss\/LEO if they can cope with the longer 9mm pin instead of the standard 6mm pin. \u003c\/p\u003e\n\u003ch3\u003e Features and benefits of the PELCO® Q Pin Stubs\u003c\/h3\u003e \u003col\u003e\n\u003cli type=\"disc\"\u003eReference notch for intrinsic indexing of any location on the Q Stub\u003c\/li\u003e\n\u003cli type=\"disc\"\u003eSquare shape for easy alignment with the X-Y axis of SEM stage\u003c\/li\u003e\n\u003cli type=\"disc\"\u003eReliable retrieval of any position on the Q Stub\u003c\/li\u003e\n\u003cli type=\"disc\"\u003eIdeal for correlative microscopy; same locations can be easily found on multiple imaging\/analyzing platforms with X-Y axis\u003c\/li\u003e\n\u003cli type=\"disc\"\u003eEnables corroborative microscopy; share between SEM platforms or re-investigate same position afterwards\u003c\/li\u003e\n\u003cli type=\"disc\"\u003ePerfect for repetitive microscopy and repetitive sample prep procedures; exact same position can be easily found and imaged over again\u003c\/li\u003e\n\u003cli type=\"disc\"\u003eLarger sample area than traditional round stubs\u003c\/li\u003e\n\u003cli type=\"disc\"\u003eFully compatible with all existing tools, grippers, SEM holders and specimen preparation equipment\u003c\/li\u003e\n\u003c\/ol\u003e\n\u003cp\u003e\u003cem\u003eCompatible with SEMs, FESEMs and SEM\/FIB systems from FEI\/Philips, Tescan, Cambridge, Leica, Amray, ASPEX, and Camscan. Also suitable for Zeiss\/LEO instruments if they can accommodate the longer 9mm pin instead of the standard 6mm pin. Available for 4, 8, 16, 24, 36, and 48 PELCO® Q Pin Stubs, or standard pin stubs with 12.7mm (1\/2\") head. \u003c\/em\u003e\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"4 ea (1\/2\") Pin Stubs","offer_id":32288787759241,"sku":"15334-22","price":111.65,"currency_code":"CAD","in_stock":true},{"title":"8 ea (1\/2\") Pin Stubs","offer_id":32288787792009,"sku":"15334-33","price":167.95,"currency_code":"CAD","in_stock":true},{"title":"16 ea (1\/2\") or 4 ea (1\") Pin Stubs","offer_id":32288787824777,"sku":"15334-44","price":224.25,"currency_code":"CAD","in_stock":true},{"title":"24 ea (1\/2\") Pin Stubs","offer_id":32288787857545,"sku":"15334-55","price":355.6,"currency_code":"CAD","in_stock":true},{"title":"36 ea (1\/2\") or 9 ea (1\") Pin Stubs","offer_id":32288787890313,"sku":"15334-66","price":552.6,"currency_code":"CAD","in_stock":true},{"title":"48 ea (1\/2\") Pin Stubs","offer_id":32288787923081,"sku":"15334-77","price":798.45,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15334-2.jpg?v=1755635215"},{"product_id":"hitachi-multiple-specimen-mount-holders","title":"Hitachi Multiple Specimen Mount Holders","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eInterchangeable\u003cbr\u003eModular SEM Specimen Holders  \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e This extensive line of specimen holders all have a female M4 thread and are compatible with all of our modular SEM Stage Adapters. If used with the Jeol or ZEISS\/LEO dovetail stage adapter one of the adapter buttons 15372 or 15372-10 is needed. \u003c\/p\u003e\n\u003cp\u003e A set of useful holders to quickly mount multiple standard Ø15mm Hitachi mounts with M4 thread on a base with M4 thread. Fully compatible with all Hitachi stage adapters using M4 threads and with all PELCO® Modular Stage Adapters. Available for 3 of 6 Hitachi mounts, flat or with 45° tilt for enhanced signal. Made of aluminum with stainless steel M4 threads. Extended Button (15372-10) is needed when used with the Dovetail Stage Adapters (15371 or 15397). \u003c\/p\u003e\n\u003cp\u003e\u003cem\u003e Screw used is M4 x 8mm, cup point socket head cap set screw, stainless steel. \u003c\/em\u003e\u003cbr\u003e\u003cstrong\u003e15433 \u003c\/strong\u003e - Triple Specimen Holder for 3 Hitachi Mounts, Ø25 x 6mm x M4\u003c\/p\u003e\n\u003cp\u003e\u003cem\u003e Screw used is M4 x 8mm, cup point socket head cap set screw, stainless steel. \u003c\/em\u003e\u003cbr\u003e\u003cstrong\u003e 15436\u003c\/strong\u003e - Multiple Specimen Holder for 6 Hitachi Mounts, Ø50 x 6mm x M4\u003c\/p\u003e\n\u003cp\u003e\u003cem\u003e Screw used is M4 x 8mm, cup point socket head cap set screw, stainless steel. \u003c\/em\u003e\u003cbr\u003e\u003cstrong\u003e15437 \u003c\/strong\u003e - Multiple Specimen Holder for 3 Hitachi Mounts, Ø50 x 6mm x M4\u003c\/p\u003e\n\u003cp\u003e\u003cem\u003eM4 screw can be rotated for optimum positioning\u003cbr\u003eScrew used is M3 x 3mm, set screw, stainless steel.  \u003c\/em\u003e\u003cbr\u003e\u003cstrong\u003e15430-3 \u003c\/strong\u003e - 45° Tilt Triple Specimen Holder for 3 Hitachi Mounts, Ø25 x 14mm x M4\u003c\/p\u003e\n\u003cp\u003e\u003cem\u003e M4 screw can be rotated for optimum positioning\u003cbr\u003eScrew used is M3 x 3mm, set screw, stainless steel. \u003c\/em\u003e\u003cbr\u003e\u003cstrong\u003e15430-6 \u003c\/strong\u003e - 45° Tilt Multiple Specimen Holder for 6 Hitachi Mounts, Ø35 x 14mm x M4        \u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"3 \/ Ø25 x 6mm","offer_id":43526573981850,"sku":"15433","price":75.05,"currency_code":"CAD","in_stock":true},{"title":"6 \/ Ø50 x 6mm","offer_id":43526574014618,"sku":"15436","price":142.6,"currency_code":"CAD","in_stock":true},{"title":"3 \/ Ø50 x 6mm","offer_id":43526574047386,"sku":"15437","price":142.6,"currency_code":"CAD","in_stock":true},{"title":"3 \/ Ø25 x 14mm","offer_id":43526574080154,"sku":"15430-3","price":127.6,"currency_code":"CAD","in_stock":true},{"title":"6 \/ Ø35 x 14mm","offer_id":43526574112922,"sku":"15430-6","price":215.8,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15433.jpg?v=1755635200"},{"product_id":"pin-mount-adapter-to-hitachi-m4-or-isi-abt-topcon-mounts","title":"Single Pin Stub Holders","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\n\u003cul class=\"tabs\"\u003e\n\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003c!--Start tab content--\u003e\n\u003cul class=\"tabs-content\"\u003e\n\u003cli class=\"active\" id=\"tab1\"\u003e\n\u003cp\u003e\u003cstrong\u003eInterchangeable\u003cbr\u003eModular SEM Specimen Holders \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003eThis extensive line of specimen holders all have a female M4 thread and are compatible with all of our modular SEM Stage Adapters. If used with the Jeol or ZEISS\/LEO dovetail stage adapter one of the adapter buttons 15372 or 15372-10 is needed.\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e 15363-1\u003c\/strong\u003e - Single Pin Stub Holder Ø15 x 10mm H, M4\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e15363-2\u003c\/strong\u003e - Single Pin Stub Holder Ø15 x 15mm H, M4\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e 15363-3\u003c\/strong\u003e - Single Pin Stub Holder Ø16 x 25mm H, M4\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e15361 \u003c\/strong\u003e- Single Pin Stub Holder Ø16 x 38mm H, M4\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e 15364\u003c\/strong\u003e - Single Pin Stub Holder Ø15 x 55mm H, M4\u003c\/p\u003e\n\u003cp\u003eFor holding and viewing SEM mounts with the standard 3.2mm pin. Made of aluminum, includes a pin locking screw. Four different heights are available: 10, 25, 38 and 55mm. Short Button Adapter (15372) is needed when used with the Dovetail stage adapters (15371 or 15397).\u003c\/p\u003e\n\u003cp\u003eScrew used is 6-32 x 1\/8 hex set screw, stainless steel.\u003c\/p\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Ø15 x 10mm","offer_id":43399281934490,"sku":"15363-1","price":46.9,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15363-1.jpg?v=1755635185"},{"product_id":"hitachi-m4-adapter-to-95mm-jeol-cylinder-mount","title":"Cylinder Adapter for JEOL Holders","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e Made of aluminum in 3 sizes, Ø9.5 x 10mm, Ø12.2 x 10mm, Ø15 x 10mm with M4. Used directly on JEOL holders. Can be used with any of the modular SEM specimen holders. \u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e 15367-25 \u003c\/strong\u003e - Ø9.5mm JEOL Cylinder Mount Adapter\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e 15367-40 \u003c\/strong\u003e - Ø12.2mm JEOL Cylinder Mount Adapter\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e 15367-20 \u003c\/strong\u003e - Ø15mm JEOL Cylinder Mount Adapter\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Ø9.5 x 10mm","offer_id":43399281770650,"sku":"15367-25","price":47.7,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15367-25.jpg?v=1755635181"},{"product_id":"hitachi-m4-adapter-to-15mm-jeol-cylinder-mount","title":"Stage Adapter for ISI\/ABT\/Topcon SEMs","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e Made of aluminum, 15mm dia x 10mm H with M4 screw. Can also be used on JEOL stage adapters or specimen holders which accommodate the 15mm cylinder stub. Can be used with any of the Modular SEM Specimen Holders. \u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e ","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32354019180681,"sku":"15367-20","price":47.7,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15367-20.jpg?v=1755635180"},{"product_id":"jeol-or-isi-abt-topcon-mounts-to-hitachi-m4-mount","title":"JEOL or ISI\/ABT\/Topcon mounts to Hitachi M4 mount","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eInterchangeable\u003cbr\u003eModular SEM Specimen Holders  \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e This extensive line of specimen holders all have a female M4 thread and are compatible with all of our modular SEM Stage Adapters. If used with the Jeol or ZEISS\/LEO dovetail stage adapter one of the adapter buttons 15372 or 15372-10 is needed. \u003c\/p\u003e\n\u003cp\u003e\u003cem\u003e Adapter Holder for Cylinder Mounts, M4 \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003e Small cylinder mount adapter accommodates JEOL or ISI\/ABT\/Topcon cylinder mounts up to 15mm diameter. Enables the use of Ø9.5 and Ø12.2mm JEOL or Ø15mm ISI\/ABT\/Topcon cylinder mounts on Hitachi M4. Made from aluminum with stainless steel screw, Allen wrench included.\u003c\/p\u003e\n\u003cp\u003eExtended Button (\u003ca href=\"https:\/\/shop.sfr.ca\/products\/extended-button-for-dovetail-stage-adapters\" target=\"_blank\" rel=\"noopener noreferrer\"\u003e15372-10\u003c\/a\u003e) is needed when used with the Dovetail Stage Adapters (\u003ca href=\"https:\/\/shop.sfr.ca\/products\/dovetail-stage-adapter-for-jeol-sem-jsm35-jsm50-jsm840-and-jxa733\" target=\"_blank\" rel=\"noopener noreferrer\"\u003e15371\u003c\/a\u003e or \u003ca href=\"https:\/\/shop.sfr.ca\/products\/dovetail-stage-adapter-for-zeiss-leo-sem\" target=\"_blank\" rel=\"noopener noreferrer\"\u003e15397\u003c\/a\u003e).\u003c\/p\u003e\n\u003cp\u003eScrews used are M3 x 6mm, socket head cap screw, stainless steel and M3 x 10mm, socket head cap screw, stainless steel. \u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32354019901577,"sku":"15401","price":67.55,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15401.jpg?v=1755635177"},{"product_id":"cross-sectional-holder","title":"Cross-Sectional Holder","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e  \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003e3.2mm pin (1\/8\") and flat point to allow easy angle changes. Insert specimens edge-on and observe the break directly. Accommodates sample thickness up to 6.35mm (1\/4\"). Non-magnetic stainless steel. Overall height is 30mm (1.2\") from the pivot point. The clamping part is a 16mm (0.62\") cube w\/o thumb screws.\u003c\/p\u003e\n\u003cp\u003eScrew used is 4-40 x 1\/2 Thumb \u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e ","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368256221321,"sku":"15325","price":168.9,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15325.jpg?v=1755635145"},{"product_id":"compact-variable-tilt-mount","title":"Compact Variable Tilt Mount","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003e This compact variable tilt specimen mount allows for easy mounting and tilting small samples from 0° – 90° and SEM investigation with small working distances. Markings for 30°, 45°, 70° and 90°. Table size is 11x14mm (0.46\" x 0.55\"). Overall size is 14 x 14.3 x14.5mm (0.55\" x 0.56\" x 0.57\"). Made of aluminum with stainless steel screw. Allen wrench included.\u003cbr\u003eScrew used is M2 x 0.4mm x 12mm Hex SHCS\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e ","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368256286857,"sku":"15339","price":121.05,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15339.jpg?v=1755635144"},{"product_id":"variable-tilt-specimen-holder","title":"Variable Tilt Specimen Holder","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eAccommodates pin stubs up to 18mm (.7\") (pin stub can be locked with set screw in tilt table) or larger specimens with a maximum size of 26 x 20mm. Tilts 0 - 90° with 10° markings. Additional markings for 30°, 45°, and 70°. Tilt table size is 26 x 20mm, overall size is 33 x 20 x 19mm H. Made of aluminum with stainless steel screws. Allen wrench included.\u003cbr\u003eScrews used are M2 x 0.4mm x 6mm Hex SHCS and M2 x 0.4mm x 3mm Hex Socket type 1 Cup Pt-SS \u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368256319625,"sku":"15450","price":553.55,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15450.jpg?v=1755635144"},{"product_id":"multi-pin-specimen-mount","title":"Multi-Pin Specimen Mount","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eAccommodates up to four standard 12.7mm (1\/2\") pin stubs, with 3.2mm (1\/8\") diameter pin. Material: machined aluminum with stainless steel allen set screws. Allen wrench included. Dimentions are Ø31.5 x 10.7mm (1.24\" x 0.42\") w\/o pin. Standard Ø3.2mm (1\/8\") pin with a length of 9.5mm (3\/8\").\u003cbr\u003e\u003cem\u003eScrew used is 6-32 x 1\/8 Hex Set, SS\u003c\/em\u003e\u003cbr\u003eMulti-Pin Specimen Mount, 4 x 3.2mm \u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368256352393,"sku":"15310","price":93.4,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15310.jpg?v=1755635143"},{"product_id":"multi-holder-for-6-pin-stubs","title":"Multi Holder for 6 Pin Stubs","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eAccommodates up to six standard 12.7mm (1\/2\") pin stubs with 3.2mm (1\/8\") pin on numbered positions. Can hold up to three 25.4mm (1\") pin stubs. Material: machined aluminum with stainless steel allen set screws. Allen wrench included. Holder size is Ø42 x 10.7mm (Ø1.65\" x 0.42\") height w\/o pin.\u003cbr\u003e\u003cem\u003eScrew used is 6-32 x 1\/8 Hex Set, SS\u003c\/em\u003e\u003cbr\u003eMulti Holder for 6 pin stubs \u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368256581769,"sku":"15310-6","price":142.6,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15310-6-1.jpg?v=1755635143"},{"product_id":"multi-holder-for-8-pin-stubs","title":"Multi Holder for 8 Pin Stubs","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eAccommodates up to eight standard 12.7mm (1\/2\") pin stubs with 3.2mm (1\/8\") pin on numbered positions. Can hold up to four 25.4mm (1\") pin stubs. Material: machined aluminum with stainless steel allen set screws. Allen wrench included. Holder size is Ø50 x 10.7mm (Ø1.97\" x 0.42\") height w\/o pin.\u003cbr\u003e\u003cem\u003eScrew used is 6-32 x 1\/8 Hex Set, SS\u003c\/em\u003e\u003cbr\u003eMulti Holder for 8 pin stubs \u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368256647305,"sku":"15310-8","price":180.15,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15310-8-5.jpg?v=1755635142"},{"product_id":"multi-holder-for-12-pin-stubs","title":"Multi Holder for 12 Pin Stubs","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eAccommodates up to twelve standard 12.7mm (1\/2\") pin stubs with 3.2mm (1\/8\") pin on numbered positions. Can hold up to four 25.4mm (1\") pin stubs. Material: machined aluminum with stainless steel allen set screws. Holder size is Ø62 x 10.7mm (Ø2.44\" x 0.42\") height w\/o pin.\u003cbr\u003e\u003cem\u003eScrew used is 6-32 x 1\/8 Hex Set, SS\u003c\/em\u003e\u003cbr\u003eMulti Holder for 12 pin stubs \u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368256680073,"sku":"15310-12","price":198.9,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15310-12-4.jpg?v=1755635142"},{"product_id":"multi-holder-for-29-pin-stubs","title":"Multi Holder for 29 Pin Stubs","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eAccommodates up to 29 standard 12.7mm (1\/2\") pin stubs with 3.2mm (1\/8\") pin. Made of aluminum with 302 type stainless steel springs to hold the pin stubs. Holder size is Ø90 x 5mm (Ø3.5\" x 0.2\") height w\/o pin.\u003c\/p\u003e\n\u003cp\u003eScrew used is 2-56 x 3\/16, Flat Head, SS\u003cbr\u003eMulti Holder for 29 pin stubs \u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368256745609,"sku":"15310-29","price":449.4,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15310-29.jpg?v=1755635141"},{"product_id":"multi-holder-for-49-pin-stubs","title":"Multi Holder for 49 Pin Stubs","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eAccommodates up to 49 standard 12.7mm (1\/2\") pin stubs with 3.2mm (1\/8\") pin. Made of aluminum with 302 type stainless steel springs to hold the pin stubs. Holder size is Ø117 x 5mm (Ø4.6\" x 0.2\") height w\/o pin.\u003c\/p\u003e\n\u003cp\u003eScrew used is 2-56 x 3\/16, Flat Head, SS\u003cbr\u003eMulti Holder for 49 pin stubs \u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368256778377,"sku":"15310-49","price":747.8,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15310-49.jpg?v=1755635141"},{"product_id":"multi-unit-specimen-mount","title":"Multi-Unit Specimen Mount","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eHolds five 9.5mm specimen mounts. Material: machined aluminum with stainless steel allen set screws. Allen wrench included. Holder size is Ø31.5 x 11.5mm\u003c\/p\u003e\n\u003cp\u003eScrew used is 6-32 x 1\/8, Hex Set, SS\u003cbr\u003eMulti-Unit Specimen Mount, 5 x 9.5mm\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368256974985,"sku":"15315","price":116.35,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15315.jpg?v=1755635140"},{"product_id":"multi-purpose-specimen-mount","title":"Multi-Purpose Specimen Mount","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cem\u003e  compatible with 3.2mm pin stub holder\u003cbr\u003ebulk or irregularly shaped specimens up to 25mm or 1\"\u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eAccepts up to 25mm (1\") diameter metallurgical mounts. Material: machined aluminum with stainless steel allen set screws. Allen wrench included. Holder size is Ø31.5 x 11mm.\u003c\/p\u003e\n\u003cp\u003ecrew used is 6-32 x 1\/2, Hex Set, SS \u003c\/p\u003e\n\u003cp\u003e15305 may be used for bulk specimens (left) or metallurgical mounts (right)\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368257433737,"sku":"15305","price":117.85,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15305.jpg?v=1755635139"},{"product_id":"cylinder-holder-22mm-7-8","title":"Cylinder Holder, 22mm (7\/8\")","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eSpecimen holder for cylinders up to 22mm (7\/8\"), standard pin stub 3.2mm (1\/8\"). Made of aluminum with stainless steel Allen screw. Allen wrench included.\u003c\/p\u003e\n\u003cp\u003eScrew used is M3 x 6mm, Soc Cap, SS \u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368257859721,"sku":"15302","price":82.55,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15302.jpg?v=1755635139"},{"product_id":"bulk-specimen-holder","title":"Bulk Specimen Holder","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003e Shown holding a mineral specimen. Maximum diameter of specimen area is 32mm (1.25\"). Machined aluminum with short and long stainless steel allen set screws. Allen wrench included.\u003c\/p\u003e\n\u003cp\u003eScrews used are M3 x 20mm, Set, SS and M3 x 10mm, Set, SS\u003cbr\u003eBulk Specimen Holder, 32mm, pin, aluminum\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368257892489,"sku":"15308","price":168.9,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15308.jpg?v=1755635138"},{"product_id":"large-bulk-specimen-holder","title":"Large Bulk Specimen Holder","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eThe large bulk specimen holder holds irregular or round specimens up to 51mm (2\") diameter. Machined aluminum with short and long stainless steel allen set screws. Allen wrench included\u003c\/p\u003e\n\u003cp\u003eScrew used is M3 x 20mm, SS\u003cbr\u003eLarge Bulk Specimen Holder, 51mm, pin, aluminum \u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368258089097,"sku":"15324","price":204.55,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15324.jpg?v=1755635138"},{"product_id":"micro-vise","title":"Micro Vise","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cem\u003e compatible with pin stub holder \u003c\/em\u003e\u003cbr\u003e\u003cbr\u003eA fast and clean way to hold specimens for SEM. The jaws are 25.4mm (1\") wide. Maximum gap is 11mm (7\/16\"). Material: machined aluminum with stainless steel allen screw. Allen wrench included.\u003c\/p\u003e\n\u003cp\u003eScrews used are 6-32 x 3\/4 Soc Head, Vent and 6-32 x 5\/16 Flat Head, SS \u003cbr\u003eMicro Vise, 3.2mm (1\/8\") pin\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368258351241,"sku":"15340","price":215.8,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15340.jpg?v=1755635137"},{"product_id":"small-springloaded-vise-clamp","title":"Small Springloaded Vise Clamp","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eSmall Springloaded vise clamp for samples up to 12.7mm (1\/2\"). The jaws are 25mm (1\") wide. Jaws also accommodate 1\/16\" x 1\/2\" stainless steel pins for more awkward shaped samples. 4 pins are included. Removable pushrod for easy loading is provided. Material: machined aluminum with stainless steel pins and springs. Overall size of vise clamp w\/o pin and pushrod 30 x 25 x 12.5mm (1.18\" x 1\" x ½\"). \u003c\/p\u003e\n\u003cp\u003e\u003ca href=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/files\/15341_15341-4TN.pdf?3865\" target=\"_blank\" rel=\"noopener noreferrer\"\u003eTechnical Notes, Small Springloaded Vise Clamp (276KB PDF)\u003c\/a\u003e\u003c\/p\u003e\n\u003cp\u003eScrew used is 2-56 x 1\/8, Set Cup, SS\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e 15341 \u003c\/strong\u003e - Small Springloaded Vise Clamp, pin\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e 15341-20 \u003c\/strong\u003e - Replacement Pins for Vise Clamp, 1\/2\" long\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Vise Clamp","offer_id":32368258384009,"sku":"15341","price":372.5,"currency_code":"CAD","in_stock":true},{"title":"Replacement Pins","offer_id":32368258416777,"sku":"15341-20","price":61.0,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15341.jpg?v=1755635137"},{"product_id":"springloaded-vise-clamp","title":"Springloaded Vise Clamp","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eSpringloaded vise clamp for samples up to 26mm. The jaws are 25mm (1\") wide. Jaws also accommodate 1\/16\" x 1\/2\" stainless steel pins for more awkward shaped samples. 4 pins are included. Removable pushrods for easy loading are provided. Material: machined aluminum with stainless steel pins and springs. Overall size of vise clamp w\/o pin and push rods 50 x 25 x 15mm (2\" x 1\" x 5\/8\").\u003c\/p\u003e\n\u003cp\u003e\u003ca href=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/files\/15343_15343-4TN.pdf?3866\" target=\"_blank\" rel=\"noopener noreferrer\"\u003eTechnical Notes, Springloaded Vise Clamp (PDF 169KB)\u003c\/a\u003e\u003c\/p\u003e\n\u003cp\u003eScrew used is 2-56 x 1\/8, Set Cup, SS \u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Vise Clamp","offer_id":32368258646153,"sku":"15343","price":577.95,"currency_code":"CAD","in_stock":true},{"title":"Replacement Pins","offer_id":32368258678921,"sku":"15341-20","price":61.0,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15343.jpg?v=1755635136"},{"product_id":"universal-springloaded-vise","title":"Universal Springloaded Vise","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eSpringloaded vise clamp with reversible jaws for an opening up to 38mm. The universal jaws have special slots to firmly hold round samples of various diameters both horizontally and vertically. Maximum width of the jaws is 32mm. Material: machined aluminum with stainless steel springs, rods, screws, washers, and brass sliders. Overall size of the vise clamp w\/o pin is 67 x 52 x 20mm (2.64\" x 2\" x 0.8\").\u003c\/p\u003e\n\u003cp\u003eScrew used is 2-56 x 1\/8, Set Cup, SS\u003cbr\u003eUniversal Springloaded Vise with Reversible Clamps, Pin \u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368258711689,"sku":"15342","price":425.0,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15342.jpg?v=1755635136"},{"product_id":"pelco-bar-clamp-vise-4-6-8","title":"PELCO® Bar Clamp Vise, 4\", 6\" and 8\"","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003e The PELCO® Bar Clamp Vise is available in three lengths; 102mm (4\"), 152mm (6\") and 203mm (8\") with the same clamps for each version. This bar type clamp can accommodate specimens up to 72mm (3\"), 127mm (5\") and 178mm (7\") in length respectively. The jaws are reversible, offering different clamping options and they operate independently anywhere on the clamping bar. This will allow for positioning the region of interest of the specimen within the travel range of the SEM stage. Stainless steel 1\/16\" pins (6 pins are included) can be placed on the clamps for awkwardly shaped samples. Clamping bars and clamps can be purchased additionally to make up the best functional set for the job at hand. Made of vacuum grade aluminum with brass bar and brass thumbscrews and stainless steel type 316 dowels. Standard 3.2mm (1\/8\") pin with 9.5mm (3\/8\") length.\u003c\/p\u003e\n\u003cp\u003eReplacement Clamp for PELCO Bar Clamp Vise\u003c\/p\u003e\n\u003col\u003e\n\u003cli type=\"disc\"\u003eOverall size for the 102mm(4\") version: LxWxH 102 x 22 x 19mm (4\" x 7\/8\" x ¾\")\u003c\/li\u003e\n\u003cli type=\"disc\"\u003eOverall size for the 152mm (6\") version: LxWxH 152 x 22 x 19mm (6\" x 7\/8\" x ¾\")\u003c\/li\u003e\n\u003cli type=\"disc\"\u003eOverall size for the 203mm (8\") version: LxWxH 203 x 22 x 19mm (8\" x 7\/8\" x ¾\")\u003c\/li\u003e\n\u003c\/ol\u003e\n\u003ca href=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/files\/15476_15476-4_15477_15477-4_15478_15478-4_TN.pdf?3867\" target=\"_blank\" rel=\"noopener noreferrer\"\u003ePELCO® Technical Notes: PELCO® Bar Clamp Vise, 4, 6, and 8\" (80KB PDF)\u003c\/a\u003e\u003cp\u003eScrew used is 4-40 x 3\/8, Thumb, Brass\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e 15477 \u003c\/strong\u003e - PELCO® Bar Clamp Vise, 102mm (4\"), complete with bar and two clamps, Pin, each\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e 15476 \u003c\/strong\u003e - PELCO® Bar Clamp Vise, 152mm (6\"), complete with bar and two clamps, Pin, each\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e15478  \u003c\/strong\u003e - PELCO® Bar Clamp Vise, 203mm (8\"), complete with bar and two clamps, Pin, each\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e 15477-10         \u003c\/strong\u003e - Additional Clamp for 102mm (4\"), 152mm (6\") or 203mm (8\") bar, each\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e15477-40          \u003c\/strong\u003e - Additional 102mm (4\") bar, Pin, each\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e 15476-60         \u003c\/strong\u003e - Additional 152mm (6\") bar, Pin, each\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e 15478-80         \u003c\/strong\u003e -  Additional 203mm (8\") bar, Pin, each\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e 15341-20         \u003c\/strong\u003e - Replacement Pins for Vise Clamp, 1\/2\" long, pkg\/10\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Vise Clamp 4\"","offer_id":32368258842761,"sku":"15477","price":759.95,"currency_code":"CAD","in_stock":true},{"title":"Vise Clamp 6\"","offer_id":32368258875529,"sku":"15476","price":806.9,"currency_code":"CAD","in_stock":true},{"title":"Vise Clamp 8\"","offer_id":32368258908297,"sku":"15478","price":853.8,"currency_code":"CAD","in_stock":true},{"title":"Additional Clamp","offer_id":32368258941065,"sku":"15477-10","price":290.85,"currency_code":"CAD","in_stock":true},{"title":"Additional Bar 4\"","offer_id":32368258973833,"sku":"15477-40","price":234.55,"currency_code":"CAD","in_stock":true},{"title":"Additional Bar 6\"","offer_id":32368259006601,"sku":"15476-60","price":272.1,"currency_code":"CAD","in_stock":true},{"title":"Additional Bar \"8","offer_id":43399280492698,"sku":"15478-80","price":319.0,"currency_code":"CAD","in_stock":true},{"title":"Replacement Pins","offer_id":32368259072137,"sku":"15341-20","price":61.0,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15477-2.jpg?v=1755635135"},{"product_id":"pelco-small-fib-grid-holder","title":"PELCO Small FIB Grid Holder","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eSimple, but effective PELCO® FIB grid holder based on a standard ø12.7mm (1\/2\") pin stub. This holder holds up to 2 FIB grids of the same thickness. Can also be used to safely store FIB grids with thin sections with attached to them. Overall dimensions are ø12.7mm (1\/2\") x 7.8mm (0.3mm) H w\/o pin. Pin is standard ø3.2mm (1\/8\"). Material: vacuum grade aluminum with brass screw. Philips screwdriver #0 included. \u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e 15464 \u003c\/strong\u003e - PELCO® Small FIB Grid Holder, ø12.7mm, Pin, each\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e 15464-20 \u003c\/strong\u003e - Replacement Brass Screws, pkg\/10\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Grid Holder","offer_id":32368259235977,"sku":"15464","price":102.35,"currency_code":"CAD","in_stock":true},{"title":"Replacement Brass Screws","offer_id":32368259301513,"sku":"15464-20","price":14.5,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15464.jpg?v=1755635134"},{"product_id":"pelco-single-1-2-fib-sample-and-grid-holder","title":"PELCO® Single 1\/2\" FIB Sample and Grid Holder","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\n\u003cul class=\"tabs\"\u003e\n\u003cli\u003e\u003ca href=\"#tab1\" class=\"active\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003c!--Start tab content--\u003e\n\u003cul class=\"tabs-content\"\u003e\n\u003cli id=\"tab1\" class=\"active\"\u003e\n\u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003eA large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eThe PELCO® Single FIB Sample and Grid Holder holds a FIB sample mounted on a pin stub for FIB milling and lift-out procedures. It also holds two FIB grids conveniently close to the sample to mount and prepare TEM lamellae on the FIB grid for subsequent TEM imaging.\u003c\/p\u003e\n\u003cp\u003eThere are two height options: standard and low profile. The standard height comes with a #16111 pin stub and the pin length of the mount is 9.5mm (3\/8\") while the low profile comes with a #16176 pin stub and the pin length of the mount is 6.5mm (1\/4\"). The low profile holder is primarily for systems that require shorter pin mounts and\/or sample heights.  This compact and cost effective holder is suitable for all FIB\/SEM systems which accept pin mount holders, such as the Thermo Fisher\/FEI, ZEISS and TESCAN systems. For the JEOL and Hitachi systems a pin mount adapter is needed.\u003c\/p\u003e\n\u003cp\u003eThe standard height (#15467) is made of vacuum grade aluminum with brass screws. Philips screwdriver #0 included. Overall size of 15467 is 22.4 x 12.7 x 11.7mm (0.88 x 0.5 x 0.46\"). Pin is 3.2mm (1\/8\") diameter x 9mm (3\/8\") length.\u003c\/p\u003e\n\u003cp\u003eThe low profile (#15487) is made of vacuum grade aluminum with stainless steel screws. Hex key is included. Overall size of 15487 (excluding pin height) is 22.4 x  12.7 x 7mm (0.88 x 0.5 x 0.28\"). Pin is 3.2mm (1\/8\") diameter x 6.5mm (1\/4\") length.\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e 15467 \u003c\/strong\u003e - PELCO® Single 1\/2\" FIB Sample and Grid Holder, Pin, each\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e 15464-20 \u003c\/strong\u003e - Replacement Brass Screws, pkg\/10\u003cbr\u003e\u003cbr\u003e\u003cstrong\u003e15487 - \u003c\/strong\u003eLow Profile PELCO® Single 1\/2\" FIB Sample and Grid Holder, Pin, each\u003cbr\u003e\u003c\/p\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Single 1\/2\"","offer_id":32368259432585,"sku":"15467","price":516.05,"currency_code":"CAD","in_stock":true},{"title":"Replacement Brass Screws","offer_id":32368259465353,"sku":"15464-20","price":14.5,"currency_code":"CAD","in_stock":true},{"title":"Low Profile Single 1\/2\"","offer_id":44885452718234,"sku":"15487","price":545.9,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15467.jpg?v=1755635134"},{"product_id":"pelco-double-1-2-fib-sample-and-grid-holder","title":"PELCO® Double 1\/2\" FIB Sample and Grid Holder","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\n\u003cul class=\"tabs\"\u003e\n\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003c!--Start tab content--\u003e\n\u003cul class=\"tabs-content\"\u003e\n\u003cli class=\"active\" id=\"tab1\"\u003e\n\u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003eA large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eThe PELCO® Double FIB Sample and Grid Holder holds FIB samples mounted on two standard 1\/2\" (12.7mm) pin stubs for FIB milling and lift-out procedures. It also holds two FIB grids of the same thickness conveniently close to the sample to mount prepared TEM lamellae on the FIB grid for subsequent TEM imaging.\u003c\/p\u003e\n\u003cp\u003eThere are two height options: standard and low profile. The standard height comes with two #16111 pin stubs and the pin length of the mount is 9.5mm (3\/8\") while the low profile comes with two #16176 pin stubs and the pin length of the mount is 6.5mm (1\/4\"). The low profile holder is primarily for systems that require shorter pin mounts and\/or sample heights. Compact and cost effective holder suitable for all FIB\/SEM systems which accept pin mount holders, such as the Thermo Fisher\/FEI, ZEISS and TESCAN systems. For the JEOL and Hitachi systems a pin mount adapter is needed.\u003c\/p\u003e\n\u003cp\u003eThe standard height (#15468) is made of vacuum grade aluminum with brass screws. Philips screwdriver #0 included. Overall size is 36.5 x 12.7 x 11.6mm (1.44 x 0.5 x 0.46\"). Pin is 3.2mm (1\/8\") diameter x 9.5mm (3\/8\") length.\u003c\/p\u003e\n\u003cp\u003eThe low profile (#15488) is made of vacuum grade aluminum with stainless steel screws. Hex key is included. Overall size of #15488 (excluding pin height) is 36.5 x  12.7 x 7mm (1.44 x 0.5 x 0.28\") . Pin is 3.2mm (1\/8\") diameter x 6.5mm (1\/4\") length.\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e 15468 \u003c\/strong\u003e - PELCO® Double 1\/2\" FIB Sample and Grid Holder, Pin, each\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003e 15464-20 \u003c\/strong\u003e - Replacement Brass Screws, pkg\/10\u003cbr\u003e\u003cbr\u003e\u003cstrong\u003e15488\u003c\/strong\u003e - Low Profile PELCO® Double 1\/2\" FIB Sample and Grid Holder, Pin\u003cbr\u003e\u003c\/p\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Double 1\/2\"","offer_id":32368259530889,"sku":"15468","price":609.85,"currency_code":"CAD","in_stock":true},{"title":"Replacement Brass Screws","offer_id":32368259563657,"sku":"15464-20","price":14.5,"currency_code":"CAD","in_stock":true},{"title":"Low Profile Double 1\/2\"","offer_id":44885468184730,"sku":"15488","price":631.15,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15468.jpg?v=1755635133"},{"product_id":"pelco-multiple-fib-grid-holder","title":"PELCO® Multiple FIB Grid Holder","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eLarger FIB grid holder capable of holding multiple FIB grids of the same thickness. Can also be used to safely store FIB grids with thin section (lamellae) attached to them. Brass thumbscrews facilitate easy loading and unloading. Overall dimensions 22.5 x 29 x 13.5mm (7\/8\" x 1-1\/8\" x 5\/8\"). Standard 3.2mm (1\/8\") pin. Material: vacuum grade aluminum with brass thumbscrews.\u003c\/p\u003e\n\u003cp\u003eScrew used is 4-40 x 3\/8, Thumb, Brass \u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368259596425,"sku":"15466","price":213.25,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15466.jpg?v=1755635133"},{"product_id":"pelco-1-fib-sample-and-grid-holder","title":"PELCO® 1\" FIB Sample and Grid Holder","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003e The FIB Sample Prep and grid Holder holds an FIB sample mounted on a standard 25mm (1\") pin stub for FIB milling and lift out procedures. It also holds FIB grids of the same thickness to mount the prepared lamellae on an FIB grid for subsequent TEM imaging. Versatile and cost effective holder suitable for all FIB\/SEM systems which accept pin mount holders such as the FEI, Zeiss and Tescan systems. For the JEOL and Hitachi systems a pin mount adapter is needed. Brass thumbscrews facilitate easy loading and un-loading.\u003c\/p\u003e\n\u003cp\u003eOverall size is 50 x 29 x 13.5mm (2\" x 1-1\/8\" x 5\/8\"). Standard ø3.2mm (1\/8\") pin. Material: vacuum grade aluminum with brass screws.\u003c\/p\u003e\n\u003cp\u003eScrews used are Screw used is 4-40 x 3\/8, Thumb, Brass and 6-32 x 1\/2, Thumb, Brass\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368259694729,"sku":"15465","price":469.1,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15465.jpg?v=1755635132"},{"product_id":"45-pin-stub-holder","title":"45° Pin Stub Holder","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eAccepts standard 12.7mm (1\/2\") pin stubs with 3.2mm (1\/8\") pin. 45° gives higher SE signal w\/o tilting specimen stage. Grooved, machined aluminum with stainless steel Allen set screw. Allen wrench included.\u003c\/p\u003e\n\u003cp\u003eScrew used is M3 x 3mm, Set, SS\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368259858569,"sku":"15329","price":74.1,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15329.jpg?v=1755635131"},{"product_id":"45-multi-holder-for-3-pin-stubs","title":"45° Multi Holder for 3 Pin Stubs","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eAccepts standard 12.7mm (1\/2\") pin stubs with 3.2mm (1\/8\") pin. Pre-Tilt 45° gives higher SE signal w\/o tilting specimen stage. Material: machined aluminum with stainless steel Allen set screws. Allen wrench included. Diameter of holder is 25.4mm (1\")\u003c\/p\u003e\n\u003cp\u003eScrew used is M3 x 3mm, Set, SS\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368259924105,"sku":"15329-3","price":127.6,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15329-3.jpg?v=1755635131"},{"product_id":"45-multi-holder-for-6-pin-stubs","title":"45° Multi Holder for 6 Pin Stubs","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eAccepts standard 12.7mm (1\/2\") pin stubs with 3.2mm (1\/8\") pin. Pre-Tilt 45° gives higher SE signal w\/o tilting specimen stage. Material: machined aluminum with stainless steel Allen set screws. Allen wrench included. Diameter of holder is 35mm (1-3\/8\")\u003c\/p\u003e\n\u003cp\u003eScrew used is M3 x 3mm, Set, SS\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368260120713,"sku":"15329-7","price":215.8,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15329-7.jpg?v=1755635130"},{"product_id":"70-ebsd-pre-tilt-pin-stub-holder","title":"70° EBSD Pre-Tilt Pin Stub Holder","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eAccepts standard 12.7mm (1\/2\") pin stubs with 3.2mm (1\/8\") pin. 70° EBSD Pre-Tilt Holder w\/o tilting specimen stage. Grooved, machined aluminum with stainless steel Allen set screw. Allen wrench included.\u003c\/p\u003e\n\u003cp\u003eScrew used is M3 x 3mm, Set, SS\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368260153481,"sku":"15329-70","price":91.95,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15329-70.jpg?v=1755635130"},{"product_id":"38-pin-stub-holder-fei-fib-pre-tilt","title":"38° Pin Stub Holder FEI FIB Pre-Tilt","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eAccepts standard 12.7mm (1\/2\") pin stubs with 3.2mm (1\/8\") pin. 38° Pre-Tilt for FEI Dual Beam Systems. Grooved, machined aluminum with stainless steel Allen set screw. Allen wrench included.\u003c\/p\u003e\n\u003cp\u003eScrew used is M3 x 3mm, Set, SS\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368260317321,"sku":"15329-38","price":90.05,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15329-36_10ae6cc8-eb43-443f-ae91-69a75580dd0d.jpg?v=1755635130"},{"product_id":"36-pin-stub-holder-zeiss-leo-fib-pre-tilt","title":"36° Pin Stub Holder Zeiss\/Leo FIB Pre-Tilt","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eAccepts standard 12.7mm (1\/2\") pin stubs with 3.2mm (1\/8\") pin. 36° Pre-Tilt for Zeiss\/Leo Cross Beam \u0026amp; other FIB Systems. Grooved, machined aluminum with stainless steel Allen set screw. Allen wrench included.\u003c\/p\u003e\n\u003cp\u003eScrew used is M3 x 3mm, Set, SS\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368260415625,"sku":"15329-36","price":90.05,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15329-36.jpg?v=1755635129"},{"product_id":"45-90-combination-holder","title":"45°\/90° Combination Holder","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eCombined specimen holder for 90° cross sections of wafers or thin samples up to 6.35mm (1\/4\") and a pin stub at 45°. Made of aluminum with stainless steel set screws. Allen wrench included.\u003c\/p\u003e\n\u003cp\u003eScrews used are 6-32 x 3\/8, Set, 316 SS and 6-32 x 1\/4, Set, 316 SS\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368260448393,"sku":"15358","price":184.85,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15358.jpg?v=1755635129"},{"product_id":"pelco®-pin-stub-extender","title":"PELCO® Pin Stub Extender","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003e12.5mm (1\/2\") high, pin stub extender allows bringing pin stubs and pin stub sample holders closer to the pole piece without moving the SEM sample stage. Multiple extenders are stackable. Compatible with all standard 3.2mm (1\/8\") pin stubs or pin stub SEM holders with maximum pin length of 10mm (0.4\"). Made of vacuum grade aluminum with stainless steel allen set screw. Allen key included\u003c\/p\u003e\n\u003cp\u003eScrew used is M3 x 3mm, Set, SS\u003cbr\u003ePELCO® Pin Stub Extender, 12.5mm (1\/2\"), 3.2mm (1\/8\") Pin\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368260513929,"sku":"15318","price":74.1,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15318_9942702a-6817-41f6-a3e1-a1085b9fd058.jpg?v=1755635128"},{"product_id":"thin-specimen-split-mount-on-pin-stub","title":"Thin Specimen Split Mount on Pin Stub","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cem\u003e12.7mm (1\/2\") dia., 3.2mm (1\/8\") dia. pin\u003cbr\u003epin length 8mm (.314\")  \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eFor examination of thin samples from textiles, plants, paper, plastics, metals, etc., in cross section. Special wide opening up to 6.4mm (1\/4\"). Grooved head. Height of head is 7.4mm (0.29\"). Pin is centered. Material: machined aluminum with stainless steel allen set screw. Allen wrench included.\u003c\/p\u003e\n\u003cp\u003eScrew used is 2-56 x 3\/8, Hex, Set, Stainless Steel \u003cbr\u003eThin Specimen Split Mount, 1\/2\", 8mm L pin\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e ","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368260579465,"sku":"15330","price":60.4,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15330.jpg?v=1755635128"},{"product_id":"thin-specimen-split-mount-amray","title":"Thin Specimen Split Mount (AMRAY)","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cem\u003e 15mm (0.59\") dia., 3.2mm (1\/8\") dia. pin\u003cbr\u003epin length 14.3mm (9\/16\")\u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eOpens to 3.75mm (3\/8\"). Height of head is 10.2mm (0.4\") and split is centered. Pin is off-center. Material: machined aluminum with two stainless steel allen set screws. Allen wrench included.\u003c\/p\u003e\n\u003cp\u003eScrew used is 2-56 x 1\/4 Hex Soc, Set, SS \u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368260972681,"sku":"15331","price":73.2,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15331.jpg?v=1755635127"},{"product_id":"set-screw-vise","title":"Set Screw Vise","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eSingle stainless steel set screw into an open slot that is 4mm (.157\") wide x 5mm (.197\") deep.\u003c\/p\u003e\n\u003cp\u003e12.7mm (1\/2\") dia. x 17.7mm (0.70\") high. Material: machined aluminum with stainless steel allen set screw. 3.2mm (1\/8\") dia. pin. Allen wrench included.\u003c\/p\u003e\n\u003cp\u003eScrew used is M3 x 6mm, Set, Stainless Steel\u003cbr\u003eSet Screw Vise, Ø12.7mm\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368261169289,"sku":"16350","price":39.05,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/16350.jpg?v=1755635126"},{"product_id":"large-set-screw-vise","title":"Large Set Screw Vise","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eSet screw vise with an open slot of 10mm (.394\") wide x 5mm (0.197\") deep. ø25mm (1\") x 17.5mm (0.69\") high. Material: machined aluminum with stainless steel set screw. 3.2mm (1\/8\") dia. Pin. Allen wrench included.\u003c\/p\u003e\n\u003cp\u003eScrews used are M3 x 6mm, Flat, Set, SS and M3 x 8mm, Flat, Set, SS\u003cbr\u003eLarge Set Screw Vise, Ø25mm\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368261365897,"sku":"15471","price":55.5,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15471.jpg?v=1755635121"},{"product_id":"double-slotted-mini-vise","title":"Double Slotted Mini Vise","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eDouble Slotted set screw vise with 2 ea. 1mm wide by 3mm deep slots, pin 3.2mm (1\/8\"). Clamp thin specimens and cross sections without the need for tape or conductive paint. Material: machined aluminum with 2 stainless steel allen set screws. Allen wrench included.\u003c\/p\u003e\n\u003cp\u003eScrew used is M2 x 3mm, Set, Stainless Steel\u003cbr\u003eDouble Slotted Set Screw Vise, Ø15mm\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368261464201,"sku":"16340","price":40.2,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/16340.jpg?v=1755635120"},{"product_id":"large-double-slotted-vise","title":"Large Double Slotted Vise","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eLarge Double Slotted Set Screw Vise with 2 ea. 2.5mm by 5mm deep slots. Dimensions ø25x8 mm (1 x 0.32\") with 3.2mm (1\/8\") pin. Clamp thin specimens and cross sections without the need for tape or conductive paint. Material: machined aluminum with 2 stainless steel allen set screws. Allen wrench included.\u003c\/p\u003e\n\u003cp\u003eScrew used is M3 x 6mm, Flat, Set, SS \u003cbr\u003eLarge Double Slotted Set Screw Vise, Ø25mm\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368261496969,"sku":"15472","price":55.95,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15472.jpg?v=1755635119"},{"product_id":"tube-needle-clamp","title":"Tube\/Needle Clamp","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eSmall tube, needle or wire clamp based on a standard Ø12.7mm (1\/2\") pin stub. Ideal for examining wire cross-sections or needle tips. Holds tube, wires and needles up to Ø2mm (0.08\"); hole is 6.5mm (1\/4\") deep. Material: vacuum grade aluminum with a stainless steel set screw. Allen wrench included.\u003c\/p\u003e\n\u003cp\u003eScrew used is 2-56 x 1\/8, Set Cup, SS \u003cbr\u003eTube\/Needle Clamp, Ø12.7mm, pin\u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368261693577,"sku":"15290","price":46.0,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15290.jpg?v=1755635119"},{"product_id":"sem-bulk-specimen-holder","title":"SEM Bulk Specimen Holder","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cem\u003eclamps bulky, irregular samples \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eOpening is 15.9mm (5\/8\") wide x 25.4mm (1\") long x 9.5mm (3\/8\") deep. 3.2mm (1\/8\") dia. pin. Material: machined aluminum with stainless steel allen set screws. Allen wrench included.\u003c\/p\u003e\n\u003cp\u003eScrew used is 6-32 x 1\/2 Hex, Set, SS \u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368261988489,"sku":"15320","price":153.85,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15320.jpg?v=1755635118"},{"product_id":"x-large-bulk-specimen-holder","title":"X-Large Bulk Specimen Holder","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cem\u003efor up to 2\" specimens \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eOpening is 52mm (2\") wide x 40mm (1-1\/2\") long x 13mm (1\/2\") deep. 3.2mm (1\/8\") dia. pin. Material: machined aluminum with stainless steel allen set screws. Allen wrench included.\u003c\/p\u003e\n\u003cp\u003eScrew used is 6-32 x 1\/2 Hex, Set, SS \u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368262021257,"sku":"15322","price":247.7,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15322.jpg?v=1755635117"},{"product_id":"xx-large-bulk-specimen-holder","title":"XX-Large Bulk Specimen Holder","description":"\u003c!-- split --\u003e\u003c!--Start tab labels--\u003e\u003cul class=\"tabs\"\u003e\u003cli\u003e\u003ca class=\"active\" href=\"#tab1\"\u003eDESCRIPTION\u003c\/a\u003e\u003c\/li\u003e\u003c\/ul\u003e\u003c!--Start tab content--\u003e\u003cul class=\"tabs-content\"\u003e\u003cli class=\"active\" id=\"tab1\"\u003e \u003cp\u003e\u003cstrong\u003eSEM Pin Mount Specimen Holders\u003cbr\u003e\u003cem\u003efor Scanning Electron Microscopy\u003c\/em\u003e \u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1\/8\") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).\u003cbr\u003e\u003cem\u003eUsed on FEI\/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs \u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cem\u003e for up to 3\" specimens\u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eOpening is 80mm (3-1\/8\") wide x 48mm (1-7\/8\") long x 13mm (1\/2\") deep. 3.2mm (1\/8\") dia. pin. Material: machined aluminum with stainless steel allen set screws. Allen wrench included.\u003c\/p\u003e\n\u003cp\u003eScrew used is 6-32 x 1\/2 Hex, Set, SS \u003c\/p\u003e\n\u003c\/li\u003e\u003c\/ul\u003e","brand":"Ted Pella","offers":[{"title":"Default Title","offer_id":32368262086793,"sku":"15323","price":292.75,"currency_code":"CAD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0036\/0579\/0831\/products\/15323.jpg?v=1755635117"}],"url":"https:\/\/sfr.ca\/collections\/sem-specimen-holders.oembed?page=4","provider":"Systems for Research","version":"1.0","type":"link"}